Offer
Microscopy Analyses
Bioimaging
Imaging of biological material using electron microscopy provides high resolution, enabling visualization of the ultrastructure of cells, organelles, and macroscopic features at the nanometer scale.
Thanks to the use of an electron beam, the technique allows the examination of very fine details inaccessible to optical methods. Electron microscopy is indispensable for morphological research, structural analysis, and visualization of biological materials at the highest magnification.
High-resolution SEM imaging of biological samples
Zeiss Auriga 60
Imaging of uncoated samples at low accelerating voltages (below 1 kV)
Zeiss Auriga 60
Fabrication and imaging of FIB cross-sections
Zeiss Auriga 60
Preparation of biological samples for SEM and TEM/STEM as well as FIB
- Leica EM UC7,
- ACE 600,
- CPD 300
Microscopic image data analysis
SEM (Scanning Electron Microscopy)
SEM imaging of microstructure, EDS analysis of composition in micro-areas, EDS mapping, EBSD phase analysis in a micro-area, Correlative analyses (SEM, CL, RS, EBSD)
Scanning electron microscopy (SEM) enables imaging of elements of (micro)structure and surface features across a wide range of magnifications, with a resolution reaching even 1 nm. Additional equipment enhances SEM capabilities, allowing for the analysis of:
- elemental composition – EDS spectroscopy
- phase composition, grain orientation, and texture analysis – EBSD
- electronic properties based on light emission (300–800 nm) under an electron beam – cathodoluminescence (CL)
- chemical composition and molecular structure of substances – Raman spectroscopy (RS)
Scanning electron microscopes, SEM:
Cathodoluminescence integrated with scanning electron microscopy (SEM) combines the precision of SEM imaging with the ability to detect and analyze light emission (photons) from a sample when it is bombarded with high-energy electrons. This technique provides valuable information on the optical properties of materials, including wide-bandgap materials, metrology and analysis in LED materials, and the distribution of trace elements in geological samples. Key research areas include materials engineering, geology, semiconductor materials, and photonic materials. Our Quanta 650F (Thermo Fisher Scientific) system is equipped with a Gatan Monarch CL detector.
Basic services:
- Collection of cathodoluminescence (CL) data with a spatial resolution of approximately 10 nanometers.
- Capability to acquire CL mapping data and spectral information from samples simultaneously using hypermaps.
Pricing:
- Price for 1 hour of basic analyses on the equipment: 230 PLN/hour. The price for more complex analyses will be determined individually.
- An additional 150 PLN should be added to the analysis cost for performing a summary report. If an extended report is required, the price will be determined individually.
Sample preparation using the FIB technique
Collection of TEM lamellae using a focused gallium ion beam from designated (micro)locations.
FIB/SEM Microscope HELIOS NANOLAB 450HP (Thermo Fisher Scientific/FEI)
Sample preparation for SEM observations
Comprehensive sample preparation for SEM observations: preparation of cross-sections, mechanical processing, deposition of thin conductive layers (e.g., carbon, gold, platinum, tungsten) prior to microscopic analysis.
TEM (Transmission Electron Microscopy)
TEM and STEM imaging, HR-TEM and HR-STEM imaging, EDS and EELS analysis, EDS and EELS mapping
Transmission electron microscopy (TEM) enables imaging of nanostructured samples with high and atomic resolution. Diffraction images allow the determination of crystallographic structure in nanoscale areas. EDS and EELS techniques extend the capabilities of TEM to elemental composition analysis (EDS) and chemical structure analysis (EELS). In STEM mode, it is possible to obtain chemical composition maps even at atomic resolution.
FIB sample preparation
Collection of TEM lamellae using a focused gallium ion beam from designated (micro)locations.
FIB/SEM Microscope HELIOS NANOLAB 450HP (Thermo Fisher Scientific/FEI)
Electron tomography
Determination of the 3D structure of thin samples with a thickness of up to 1 µm
Mineralogical analysis (QEMSCAN®)
QEMSCAN® analysis with sample preparation
QEMSCAN® combines a scanning electron microscope (SEM) with an EDS system (energy-dispersive X-ray spectroscopy) and specialized software that automatically classifies minerals based on their chemical and structural characteristics. The analysis is performed pixel by pixel (so-called raster scanning), and the data are processed into mineralogical maps and quantitative tables.
Scanning Electron Microscope SEM FEI QUANTA 650F (QEMSCAN®) (Thermo Fisher Scientific/Company)
Do you have a question?
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Looking for reliable laboratory analyses or customized solutions tailored to your needs? Our experts are ready to answer your questions and advise you on the best options. Contact us today!
- laboratoria@port.lukasiewicz.gov.pl
- +48 510 131 925
- 147 Stabłowicka Street, 54-066 Wrocław
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