X-ray Analyses

Offer

X-ray Analyses

Qualitative phase composition
Quantitative phase composition
Average crystallite size
Lattice strains
In-situ phase transitions
Reflectometry
Thin-film studies using HR-XRD

Identification of qualitative and quantitative phases, calculation of average crystallite size, microstrains, phase transitions (up to 1200°C), and thin-film analysis (HR-XRD).
Empyrean X-ray Diffractometer (PANalytical)

XRF analysis

The EDXRF spectrometer enables the qualitative and quantitative characterization of solid, liquid, and powder samples. The method is considered non-destructive. Samples for analysis are typically prepared by melting and pressing using specialized equipment. This allows preparation in the form of fused beads or pressed pellets. Liquid samples are poured into a disposable container (50 ml) covered with a high X-ray–transmission film. Powdered materials can also be analyzed in such containers.

Main measurement parameters:

  • Element range: sodium to uranium (Na–U).


  • Concentration range: from ppm to 100%
  • Operating modes: air, helium, vacuum
  • Generator voltage: max. 50 kV
  • Anode material: silver (Ag) Z=47
  • HighSense XP Silicon Drift detector
  • Chamber with an automatic sample feeder, i.e., a carousel that can hold up to 11 samples.

Basic services:

  • Elemental composition analysis for solid, fused, pressed, powdered samples (pellets approx. 40 mm/5 mm) or liquid samples (50 ml container).
  • Determination of layer thickness and elemental composition in individual layers.

Pricing:

  • Price for 1 hour of basic analyses on the equipment: 210 PLN/hour. The price for more complex analyses will be determined individually. For most samples, measurement time does not exceed one hour including sample preparation.
  • An additional 150 PLN should be added to the analysis cost for preparing a summary report. If an extended report is required, the price will be determined individually.


XRF Spectrometer S2 Puma (Bruker)

SEM imaging with EDS

The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition at specific points or within selected areas. EDS microanalyzers serve as additional equipment in SEM and TEM electron microscopes.

All SEM electron microscopes we operate

TEM imaging including EDS analysis in TEM

The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition at specific points or within selected areas. EDS microanalyzers serve as additional equipment in SEM and TEM electron microscopes.

All TEM electron microscopes we operate

HR-TEM imaging including EDS and/or EELS analysis


The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition at specific points or within selected areas. EDS microanalyzers serve as additional equipment in SEM and TEM electron microscopes.

Transmission electron microscope TEM FEI TITAN3 G2 60-300 (FEI Company)


Do you have a question?

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