Materials Science & Engineering Center
Materials Research Laboratory
Services
The laboratory offers a wide range of research services in the field of material analysis and characterization.
We perform advanced microscopy analyses (SEM, TEM), X-ray analyses (XRD, XRF, EDS), as well as elemental analyses (ICP-OES, elemental analysis), enabling detailed examination of the structure and composition of materials. We also offer thermal analyses (TGA, DSC, TMA, DMA), which allow for the assessment of material properties as a function of temperature. The offer is complemented by functional group identification techniques (FTIR, Raman spectroscopy), laser micromachining, as well as aging tests and other physicochemical measurements.
Our advanced measurement equipment and specialized expertise enable us to carry out commercial assignments as well as research and development work.
Microscopy Analyses
SEM (Scanning Electron Microscopy)
Obrazowanie SEM mikrostruktury, Analiza EDS składu w mikroobszarach, Mapowanie EDS, Analiza fazowa EBSD w mikroobszarze, Analizy korelacyjne (SEM, CL, RS, EBSD)
Scanning Electron Microscopy (SEM) enables imaging of elements of the (micro)structure and surface features across a wide range of magnifications with a resolution of up to 1 nm. Additional equipment expands the capabilities of SEM microscopes to include analysis of:
- elemental composition – EDS spectroscopy
- phase composition, grain orientation, and texture analysis – EBSD
- electronic properties based on light emission (300–800 nm) under electron beam excitation – cathodoluminescence (CL)
- chemical composition and molecular structure of substances – Raman spectroscopy (RS)
Scanning electron microscopes, SEM:
Integrated cathodoluminescence with scanning electron microscopy (SEM-CL) combines precise SEM imaging with the ability to detect and analyze light emission (photons) from the sample excited by high-energy electrons. This technique provides valuable information on the optical properties of materials, making it widely used in energy research, metrology, LED materials analysis, and trace mineral distribution studies in geological samples. It is also applicable in the fields of materials engineering, geology, materials science, and photonic and optoelectronic technologies. Our QUANTA 650F (Thermo Fisher Scientific) model is equipped with the Gatan Monarch CL detector.
Basic services:
- Collection of cathodoluminescence (CL) data with a spatial resolution of approximately 10 nanometers.
- Possibility of simultaneous acquisition of CL mapping data and spectral information from samples using hyperspectral imaging.
Price list:
- The price for 1 hour of basic analyses on the equipment: 230 PLN/hour. More complex analyses will be priced individually.
- An additional fee of 150 PLN should be added for preparing a summary report. If an extended report is required, the price will be determined individually.
Sample preparation using the FIB method
Collection of TEM lamellae using a focused gallium ion beam from selected (micro)locations.
FIB/SEM microscope HELIOS NANOLAB 450HP (Thermo Fisher Scientific/FEI)
Sample preparation for SEM observations
Comprehensive sample preparation for SEM observations: sample preparation, mechanical processing, coating with thin conductive layers (e.g., carbon, gold, platinum, tungsten) prior to microscopic analysis.
TEM (Transmission Electron Microscopy)
TEM and STEM imaging, HR-TEM and HR-STEM imaging, EDS and EELS analysis, EDS and EELS mapping
Transmission Electron Microscopy (TEM) enables imaging of sample nanostructures with high and atomic resolution. Diffraction patterns allow the determination of crystallographic structure and nanoscale defects. EDS and EELS techniques extend the capabilities of TEM by enabling elemental composition analysis (EDS) and chemical composition analysis (EELS). In STEM mode, it is possible to obtain chemical composition maps with atomic-scale resolution.
FIB preparation
Collection of TEM lamellae using a focused gallium ion beam from selected (micro)locations.
FIB/SEM microscope HELIOS NANOLAB 450HP (Thermo Fisher Scientific/FEI)
Electron tomography
Determination of the 3D structure of thin samples with a thickness of up to 1 µm
Mineralogical analysis (QEMSCAN®)
QEMSCAN analysis with sample preparation
QEMSCAN® integrates a scanning electron microscope (SEM) with an EDS system (energy-dispersive X-ray spectroscopy) and dedicated software that automatically classifies minerals based on their chemical and structural characteristics. The analysis is performed pixel by pixel (raster scanning) and processed into mineralogical maps and quantitative tables.
Scanning Electron Microscope SEM FEI QUANTA 650F (QEMSCAN®) (Thermo Fisher Scientific/Company)
Spectroscopy Analyses
FTIR (Fourier-transform infrared spectroscopy)
Confirmation of identity and/or identification of major functional groups using FTIR
FTIR spectrometry enables the identification of functional groups and chemical bonds, analysis of substance purity, detection of impurities, and examination of the surfaces of polymeric, organic, and mineral materials.
FTIR spectrometer Nicolet 6700 (Thermo Scientific)
Identification of major functional groups, mapping, and/or defect analysis using µ-FTIR
FTIR microscopy enables the analysis of materials on a microscopic scale. It allows for surface mapping and precise defect analysis.
FTIR microscope Nicolet iN10 MX (Thermo Scientific)
Raman spectroscopy
Raman spectroscopy measurements
Analysis of the chemical and crystalline structure of materials, including polymers, ceramics, graphene, and nanomaterials. Mapping with micrometer-scale resolution is available.
Raman confocal microscope WITec alpha300 R
X-ray Analyses
XRD (X-ray diffraction)
Jakościowy skład fazowy
Ilościowy skład fazowy
Średnia wielkość krystalitów
Naprężenia sieciowe
Przemiany fazowe in-situ
Reflektometria
Badania cienkich warstw HR-XRD
XRF (X-ray fluorescence)
XRF analysis
The EDXRF spectrometer enables qualitative and quantitative determination of the composition of solid, liquid, and powder samples. The method is considered non-destructive. Samples for analysis are usually prepared by melting and pressing using specialized equipment. This allows samples to be obtained in the form of a fused bead or pressed pellet. For liquids, they are poured into a disposable container (50 ml), which is tightly sealed with a foil permeable to X-rays. Powdered materials can also be analyzed in such containers.
Main measurement parameters:
- Element range: sodium to uranium (Na–U).
- Concentration range: ppm to 100%
- Modes: air, helium, vacuum
- Generator voltage: max. 50 kV
- Anode material: silver (Ag) Z=47
- HighSense XP Silicon Drift detector
- Chamber with an automatic sample feeder, a carousel that can hold up to 11 samples.
Basic services:
- Elemental composition analysis for solid, molten, pressed, and powdered materials (pressed pellet approx. 40 mm/5 mm) or liquid samples (50 ml container).
- Determination of layer thickness and elemental composition in individual layers.
Price list:
- The price for 1 hour of basic analyses on the equipment: 210 PLN/hour. More complex analyses will be priced individually. The measurement time for most samples does not exceed one hour together with sample preparation.
- An additional fee of 150 PLN should be added for preparing a summary report. If an extended report is required, the price will be determined individually.
Spectrometer XRF S2 Puma (Bruker)
EDS (Energy-dispersive X-ray spectroscopy)
SEM imaging with EDS
The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition in specific points or areas. EDS microanalyzers constitute additional equipment in SEM and TEM electron microscopes.
All available SEM electron microscopes
TEM imaging including EDS analysis on TEM
The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition in specific points or areas. EDS microanalyzers constitute additional equipment in SEM and TEM electron microscopes.
All available TEM electron microscopes
HR-TEM imaging including EDS and/or EELS analysis
The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition in specific points or areas. EDS microanalyzers constitute additional equipment in SEM and TEM electron microscopes.
Transmission electron microscope TEM FEI TITAN3 G2 60-300 (FEI Company)
Elemental Analyses
ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometry)
Qualitative or quantitative analysis of solid substances and/or solutions using ICP-OES
Elemental Analysis (C, S)
Determination of carbon and sulfur content (inorganic and organic matrix)
Measurements for determining carbon and sulfur content are performed using automated elemental analyzers: ElenMentar CS-r (Eltra) and CS744 (LECO). The operating principle is based on combustion of the sample in an oxygen atmosphere and detection of combustion gases in selective infrared sensors. The measurements are highly sensitive and precise. For each analyzed sample, measurements are performed as independent determinations.
Basic services:
- Simultaneous determination of carbon (C) and sulfur (S) content in materials with an organic matrix (soils, waste, wood, oils, coal, coke) and inorganic matrix (metals, ores, ceramics)
Price list:
- Net price for performing basic analyses for 1 sample: 130 PLN.
- An additional fee of 150 PLN should be added for preparing a summary report.
Analyzers for determining carbon and sulfur content: CS744 (LECO) and CS-r (ELTRA)
XRF (X-ray fluorescence)
XRF analysis
The EDXRF spectrometer enables qualitative and quantitative determination of the composition of solid, liquid, and powder samples. The method is considered non-destructive. Samples for analysis are usually prepared by melting and pressing using specialized equipment. This allows samples to be obtained in the form of a fused bead or pressed pellet. For liquids, they are poured into a disposable container (50 ml), which is tightly sealed with a foil permeable to X-rays. Powdered materials can also be analyzed in such containers.
Main measurement parameters:
- Element range: sodium to uranium (Na–U).
- Concentration range: ppm to 100%
- Modes: air, helium, vacuum
- Generator voltage: max. 50 kV
- Anode material: silver (Ag) Z=47
- HighSense XP Silicon Drift detector
- Chamber with an automatic sample feeder, a carousel that can hold up to 11 samples.
Basic services:
- Elemental composition analysis for solid, molten, pressed, and powdered materials (pressed pellet approx. 40 mm/5 mm) or liquid samples (50 ml container).
- Determination of layer thickness and elemental composition in individual layers.
Price list:
- The price for 1 hour of basic analyses on the equipment: 210 PLN/hour. More complex analyses will be priced individually. The measurement time for most samples does not exceed one hour together with sample preparation.
- An additional fee of 150 PLN should be added for preparing a summary report. If an extended report is required, the price will be determined individually.
Spectrometer XRF S2 Puma (Bruker)
EDS (Energy-dispersive X-ray spectroscopy)
SEM imaging with EDS
TEM imaging including EDS analysis on TEM
HR-TEM imaging including EDS and/or EELS analysis
The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition in specific points or areas. EDS microanalyzers constitute additional equipment in SEM and TEM electron microscopes.
All available SEM and TEM electron microscopes
Thermal Analyses
TGA, DSC, TMA, DMA
Thermogravimetric analysis (TGA)
TGA enables the assessment of changes in sample mass as a function of temperature or time, allowing the analysis of thermal stability of tested materials, including determination of degradation temperature, the amount of inorganic additives, and individual decomposition stages.
Thermogravimetric analyzer TGA 2 (Mettler Toledo)
Differential scanning calorimetry (DSC)
DSC is used to study thermal effects associated with phase transitions, such as melting, crystallization, or glass transition, by measuring the amount of heat absorbed or released by the sample.
Dynamic mechanical analysis system DMA/SDTA 861 (Mettler Toledo)
Thermomechanical analysis (TMA)
TMA allows monitoring dimensional changes of a material under the influence of temperature, which is used, among others, to determine the coefficient of thermal expansion (CTE), glass transition, or softening temperature.
Thermomechanical analysis system TMA/SDTA LN 600 | LF 1100 (Mettler Toledo)
Dynamic mechanical analysis (DMA)
DMA enables characterization of the mechanical properties of a material as a function of temperature and frequency by analyzing its response to dynamic loading. This is particularly useful for evaluating elasticity and vibration damping.
Dynamic mechanical analysis system DMA/SDTA 861 (Mettler Toledo)
Coupled STA/TG-DSC analysis (FTIR/QMS)
TG / DSC analysis
The coupled STA method combines simultaneous TG/DSC measurements, enabling determination of essential thermal parameters (thermal stability, phase transition temperatures).
Thermal analyzer (TG-DSC) STA 449 F1 Jupiter (Netzsch)
Coupled TG / DSC / FTIR / QMS analysis
The coupled STA method combines simultaneous TG/DSC measurements with qualitative analysis of gases released during heating using FTIR spectroscopy and QMS mass spectrometry.
Thermal analyzer coupled with QMS and IR with ATR (Netzsch STA 449 F1 Jupiter; Bruker FTIR Tensor 27; QMS Aeolos)
Thermal conductivity (LFA, HFM)
LFA analysis
The laser flash method (LFA) enables the determination of thermal conductivity of solid materials through the measurement of thermal diffusivity.
Laser system for thermal diffusivity measurements LFA 457 MicroFlash (Netzsch)
HFM analysis
The HFM heat flow meter allows measurement of the thermal conductivity of insulating materials.
Thermal conductivity measurement system HFM 436 Lambda (Netzsch)
Laser Micromachining
Cutting, engraving, structuring
Selective removal of thin layers
Cutting/substrate structuring
Digital microscopy (Keyence microscope)
Functional laser micromachining
The maskless DLIP (Direct Laser Interference Patterning) technique enables the creation of micro- and nanostructures that provide surfaces with new functionalities: hydrophobicity, adhesion, conductivity, or optical properties. It is used, among others, in surface engineering, biomaterials, photonics, and printed electronics.
Picosecond laser micromachining system Optec SP450T with DLIP module
Aging Tests
Aging with UV-A, UV-B exposure
Determination of material/coating resistance to climatic conditions (sunlight – UV-A or UV-B, temperature, humidity)
Accelerated aging chamber with UV QUV Spray lamps (Q-Lab)
Thermal shocks (cyclic changes)
Testing material resistance to thermal shocks, rapid transfer of samples between chambers with higher and lower temperatures
Salt fog chamber WSC KWT450/SO2 (Weiss)
Salt fog
Testing corrosion resistance after exposure to salt spray with SO2 option
Salt fog chamber WSC KWT450/SO2 (Weiss)
Climatic
Testing material resistance to elevated temperature and humidity
Climatic chamber WK3-340 (Weiss)
Other Specialized Services
Porous materials testing
Physical gas adsorption
Porosity analysis of materials using physical adsorption
Physical adsorption of gases, such as nitrogen, at low temperatures enables the evaluation of surface and structural properties of materials, including pore size and volume, as well as specific surface area.
Analyzer for physical sorption 3Flex (Micromeritics)
Mercury porosimetry
Porosity analysis of materials using mercury porosimetry
Mercury porosimetry involves analyzing material porosity by forcing mercury into pores under high pressure. It enables precise determination of pore size distribution, pore volume, and density, which is essential for evaluating materials used in filtration, catalysis, and energy storage.
Mercury porosimeter AutoPore IV 9510 (Micromeritics)
Density measurement
True density analysis of solid materials
This method is used for precise measurement of the true density of solid materials and powders, using helium flow as a gas penetrating micropores. Due to its high accuracy and non-destructive nature, it is widely applied in the analysis of porous materials, ceramics, and composites.
Helium pycnometer AccuPyc 1340 (Micromeritics)
Surface and particle size analysis
Surface tension measurement
Surface tension measurement of liquids
An optical goniometer uses droplet shape analysis to determine the contact angle, enabling the assessment of surface hydrophilicity or hydrophobicity.
Tensiometer DCAT11 (DataPhysics Instrument)
Contact angle measurement
Contact
An optical goniometer uses droplet shape analysis to determine the contact angle, enabling the assessment of surface hydrophilicity or hydrophobicity.
Optical goniometer OCA35 (DataPhysics Instrument)
Particle size and zeta potential measurement (DLS analysis)
True density analysis of solid materials
The dynamic light scattering (DLS) method allows precise measurement of particle size distribution and zeta potential of particles suspended in liquid.
Helium pycnometer AccuPyc 1340 (Micromeritics)
Electrical properties testing
A system for measuring resistivity and carrier mobility using the Hall effect, HMS 8407 (LakeShore Cryotronics). It is ideal for measuring temperature-dependent resistivity and mobility from 1 to 10⁶ cm²/V·s. An optional AC measurement mode is available, extending mobility measurement down to 10⁻³ cm²/V·s.
The maximum field strength for DC current is up to 2.25 T (8407) and for AC current up to 1.31 T (8407). Measurements can be performed in the standard resistance range of 0.5 mΩ to 10 MΩ. The high-resistance option extends the range up to 200 GΩ. The low-resistance option significantly reduces resistance noise levels. The device operates across a wide temperature range from 15 K to 1273 K. All measurements may be conducted at room temperature, elevated temperature (up to 1273 K), or reduced temperature (from 15 K).
Basic services:
- Measurement of carrier mobility, carrier type, and concentration
- Measurement of resistivity and the Hall coefficient
- Hall voltage measurements
Price list:
- The price for 1 hour of basic analyses on the equipment: 227 PLN/hour. More complex analyses will be priced individually.
- An additional fee of 150 PLN should be added for preparing a summary report.
HMS 8407 system (LakeShore Cryotronics)
Thermal treatment of samples
High-temperature furnace annealing of samples, e.g., for sintering or other purposes.
High-temperature furnaces
Annealing in drying ovens (air, vacuum) up to 300°C
Laboratory dryers
Histology
Preparation of tissue material samples
Microtome, tissue processor, cryostat
Processor for staining and sealing specimens with film
Training in selected research techniques
We invite you to contact us:
- laboratoria@port.lukasiewicz.gov.pl
- +48 510 131 925
- 147 Stabłowicka Street, 54-066 Wrocław