Offer
Elemental Analyses
ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometry)
Qualitative or quantitative analysis of solid substances and/or solutions using ICP-OES
Elemental Analysis (C, S)
Determination of carbon and sulfur content (inorganic and organic matrix)
Carbon and sulfur measurements are performed on automatic elemental analyzers: Elementar CS-r (Eltra) and CS744 (LECO). The instruments operate by combusting sample material in an oxygen-rich atmosphere and detecting combustion gases in selective infrared cells. The measurement is highly precise and fast. Each sample is analyzed independently.
Basic services:
- Simultaneous determination of carbon (C) and sulfur (S) content in materials with an organic matrix (soil, sediments, wood, oil, coal, coke) and inorganic matrix (metals, ores, ceramics)
Pricing:
- Net price for performing basic analyses for 1 sample: 130 PLN.
- An additional 150 PLN should be added to the analysis cost for preparing a summary report.
Analyzers for determining carbon and sulfur content: CS744 (LECO) and CS-r (ELTRA)
XRF (X-ray Fluorescence)
XRF analysis
The EDXRF spectrometer enables qualitative and quantitative determination of the composition of solid, liquid, and powder samples. The method is classified as non-destructive. Samples for analysis are usually prepared by melting and pressing using specialized equipment. This allows the sample to be obtained as a fused bead or a pressed pellet. For liquid samples, they are poured into a disposable container (50 ml) covered with a high X-ray–transmission film. Powdered materials can also be analyzed in such containers.
Main measurement parameters:
- Element range: sodium to uranium (Na–U).
- Concentration range: ppm to 100%.
- Measurement modes: air, helium, vacuum
- Generator voltage: max. 50 kV
- Anode material: silver (Ag) Z=47
- Detector HighSense XP Silicon Drift
- Chamber with an automatic sample feeder, i.e., a carousel that can hold up to 11 samples.
Basic services:
- Elemental composition analysis for solid, fused, pressed, powdered samples (pellets approx. 40 mm/5 mm) or liquids (50 ml sample container).
- Determination of layer thickness and elemental composition in individual layers.
Pricing:
- Price for 1 hour of basic analyses on the equipment: 210 PLN/hour. The price for more complex analyses will be determined individually. For most samples, measurement time does not exceed one hour including sample preparation.
- An additional 150 PLN should be added to the analysis cost for preparing a summary report. If an extended report is required, the price will be determined individually.
XRF Spectrometer S2 Puma (Bruker)
EDS (Energy-Dispersive X-ray Spectroscopy)
SEM imaging with EDS
TEM imaging including EDS analysis in TEM
HR-TEM imaging including EDS and/or EELS analysis
The EDS technique (energy-dispersive X-ray spectroscopy) enables rapid determination of elemental composition at specific points or within defined areas. EDS microanalyzers serve as auxiliary equipment integrated into SEM and TEM electron microscopes.
All electron microscopes (SEM and TEM) we operate
Do you have a question?
Contact with us
Looking for reliable laboratory analyses or customized solutions tailored to your needs? Our experts are ready to answer your questions and advise you on the best options. Contact us today!
- laboratoria@port.lukasiewicz.gov.pl
- +48 510 131 925
- 147 Stabłowicka Street, 54-066 Wrocław
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